M&M Conference, Milwaukee, August 2026

The Microscopy Society of America M&M Conference, Milwaukee, August 2026

I have a poster presentation accepted for the conference and I will be presenting on Monday, August 3. Please drop by for a demo of the Sinterapt software.



Here's the abstract for the presentation. Thanks to my coauthor from Cameca, David Reinhard

General purpose strategies for handling peak overlaps in Atom Probe data

Olof Hellman(a) and David Reinhard(b)

a - Tomographic LLC, Bothell, WA, USA.
b - CAMECA Instruments Inc., Madison, WI, USA.

Analysis of Atom Probe data is often made less straightforward by the fact that peaks overlap. This means that ions with a mass to charge ratio that could correspond to multiple possible ions need to be handled as a special case.

For completely homogenous samples, it is usually straightforward to decompose a peak based on the sizes of peaks of different isotopes for the same ions. But most samples of interest are not homogenous.

We implement some different strategies for assigning such an ion's identity, and use these strategies on simulated datasets where the ideal results for concentration profiles or proxigrams are known, and thus see how successful each strategy is in practice in producing the expected outcome. We include samples with precipitates, with interfacial segregation, and with multi-layer materials. We review performance of different strategies and the practicality of integrating them with general purpose software like IVAS.